Sirchie Primer Residue Collection Kit for SEM Scanning Electron Microscopy & AAA Atomic Absorption Analysis

Make your forensic investigations more precise and efficient with the Sirchie Primer Residue Collection Kit, specifically designed for SEM Scanning Electron Microscopy and AAA Atomic Absorption Analysis. This professional-grade kit is an essential tool for departments that utilize advanced residue analysis techniques in their investigations.

The kit features special alloy aluminum specimen mounts that are free from barium, lead, or antimony - the most common constituents in primers. This ensures that your samples remain uncontaminated and your results accurate. The process of sample collection is straightforward and user-friendly. Simply remove the cap with the carbon-covered metal stub, apply it to the area under investigation, and return the metal stub to its original location in the holder.

The Sirchie Primer Residue Collection Kit is not just efficient but also economical. It includes all the necessary components for collecting primer residue for atomic absorption analysis, eliminating the need for additional purchases. This innovative kit is a testament to Sirchie's commitment to providing high-quality, durable forensic products that meet the needs of professionals in the field.

Whether you're conducting a detailed forensic investigation or carrying out routine residue analysis, the Sirchie Primer Residue Collection Kit for SEM Scanning Electron Microscopy and AAA Atomic Absorption Analysis is a reliable choice that delivers accurate and reliable results every time.