Tri-Tech Forensics D Stub Scanning Electron Microscopy, SEM, Collection Device, Case of 50

Bring precision and reliability to your forensic analysis with our D Stub Scanning Electron Microscopy (SEM) Collection Devices. Manufactured by the trusted brand, Tri-Tech Forensics, these collection devices are identical to those found in our renowned SEM Gunshot Residue Evidence Collection Kits.

Available in three variants - Standard, Q-Stub, and D-Stub, each vial is meticulously designed to ensure the highest quality of sample collection. Inside, you'll find an SEM stub, meticulously covered with a double-sided adhesive carbon tape. This innovative design ensures secure adhesion of your sample, providing accurate and reliable results during SEM analysis.

Each SEM Collection Device also includes a blank write-on label. This user-friendly feature allows for precise documentation of the sample's origin, enhancing traceability and ensuring rigorous scientific methodology.

Our SEM Collection Devices are not just limited to gunshot residue collection. They are versatile tools, perfect for a wide range of forensic applications. Use them for explosive residue collection from pipe bombs or primer residue, inorganic particle matter collection for SEM analysis, or for preparing standards for future comparisons. They are also ideal for the comparison and/or analysis of diverse materials such as paint chips, glass, soil, fibers, and hair.

Experience the fusion of innovation, quality, and reliability with our D Stub Scanning Electron Microscopy (SEM) Collection Devices, the preferred choice for professionals in materials science, biology, and electronics.